Department of Mechanical Engineering, Iowa State University, Ames, Iowa 50011, USA.
Opt Lett. 2010 Dec 15;35(24):4121-3. doi: 10.1364/OL.35.004121.
Recently, a study showed that generating sinusoidal fringe patterns by properly defocusing binary ones can significantly simplify three-dimensional shape measurement system development and drastically improve its speed. However, when the fringe stripes are very wide, it is very difficult for this technique to achieve high-quality measurement. This Letter presents a method to improve this technique by selectively eliminating high-frequency harmonics induced by a squared binary pattern. As a result, better sinusoidal fringe patterns can be generated with a small degree of defocusing even for wide fringe stripes. Simulation and experiments will be presented to verify the performance of this proposed technique.
最近，一项研究表明，通过适当离焦二进制条纹图案可以显著简化三维形状测量系统的开发，并大幅提高其速度。然而，当条纹很宽时，该技术很难实现高质量的测量。本研究提出了一种通过选择性消除平方二进制图案引起的高频谐波来改进该技术的方法。结果，即使对于较宽的条纹，也可以通过较小的离焦程度生成更好的正弦条纹图案。将给出仿真和实验结果以验证所提出技术的性能。
