Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), D-76128 Karlsruhe, Germany.
Ultramicroscopy. 2011 Jan;111(2):159-68. doi: 10.1016/j.ultramic.2010.10.009. Epub 2010 Oct 20.
Transmission electron microscopy phase-contrast images taken by amorphous carbon film-based phase plates are affected by the scattering of electrons within the carbon film causing a modification of the image-wave function. Moreover, image artefacts are produced by non-centrosymmetric phase plate designs such as the Hilbert-phase plate. Various methods are presented to correct phase-contrast images with respect to the scattering of electrons and image artefacts induced by phase plates. The proposed techniques are not restricted to weak-phase objects and linear image formation. Phase-contrast images corrected by the presented methods correspond to those taken by an ideal centrosymmetric, matter-free phase plate and are suitable for object-wave reconstruction.
基于非晶态碳膜的位相板所拍摄的透射电子显微镜相衬图像会受到碳膜内电子散射的影响，从而导致图像波函数发生改变。此外，非中心对称位相板设计，如希尔伯特位相板，会产生图像伪影。本文提出了多种方法来校正位相板引起的电子散射和图像伪影对相衬图像的影响。所提出的技术不仅限于弱位相物体和线性图像形成。通过所提出的方法校正后的相衬图像对应于由理想的中心对称、无物质的位相板拍摄的图像，并且适用于物波重建。
