Department of Chemical Engineering, Auburn University, 212 Ross Hall, Auburn University, Auburn, Alabama 36849, USA.
Opt Lett. 2011 Jan 15;36(2):214-6. doi: 10.1364/OL.36.000214.
Digital phase-shifting interferometry (PSI), a technique widely used in optical testing, requires interferograms collected at optical phase differences separated by a definite phase step. The five-frame interferogram-collecting sequence suggested by Hariharan et al. [Appl. Opt. 26, 2504 (1987)] is extremely effective in significantly reducing the errors in height profiles derived using PSI that are caused by phase-step errors. In this Letter, we report on a class of five-frame sequence that, owing to its mathematical equivalence with the one suggested by Hariharan et al. and its ease of execution, is more commonly used but is much less effective in reducing the height profile errors caused by phase-step errors.
数字相移干涉测量法(PSI)是一种广泛应用于光学测试的技术,需要在光学相位差分离的确定相位步长处收集干涉图。Hariharan 等人提出的五帧干涉图采集序列[Appl. Opt. 26, 2504 (1987)]在显著降低 PSI 高度轮廓中由相位步长误差引起的误差方面非常有效。在这封信中,我们报告了一类五帧序列,由于它与 Hariharan 等人提出的序列在数学上是等效的,并且易于执行,因此它的使用更为普遍,但在降低相位步长误差引起的高度轮廓误差方面效果要差得多。