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使用微通道板聚焦和准直 X 射线:实验研究。

Focusing and collimation of x rays using microchannel plates: an experimental investigation.

机构信息

School of Physics, The University of Melbourne, Parkville, Victoria 3052, Australia.

出版信息

J Xray Sci Technol. 1990 Jan 1;2(2):117-26. doi: 10.3233/XST-1990-2203.

Abstract

Focusing and collimation of 8 keV x rays has been demonstrated using microchannel plate (MCP) blanks with cylindrical channels. The focusing effect arises from total external reflection of x rays at the interior surfaces of the channels of a MCP and has been described previously by the authors. Point to point focusing was observed with flat and curved MCPs, and collimation from a point source to a quasi-parallel beam was observed with a curved MCP. Intensity profiles at the image plane and at other planes behind a flat MCP were obtained for a 20 × 40 μm2 x-ray source, and agree well with theoretical predictions. The flux in a 40-μm-diameter collector in the image plane was compared with the flux in the same plane, but without a MCP. The relative gain in flux increases linearly with the source to MCP distance, as predicted. A maximum relative gain in flux of 18 ± 1 was observed for a source to detector distance of 50 cm.

摘要

已使用具有圆柱形通道的微通道板 (MCP) 坯料演示了 8 keV X 射线的聚焦和准直。聚焦效应源于 MCP 通道内表面的 X 射线全内反射,作者之前已经对此进行了描述。观察到了平面和曲面 MCP 的点聚焦,并且使用曲面 MCP 从点源对到准平行光束进行了准直。对于 20×40μm2 X 射线源,在平面 MCP 后的像平面和其他平面上获得了强度分布,并与理论预测吻合良好。在像平面上的 40μm 直径收集器中的通量与没有 MCP 的相同平面上的通量进行了比较。通量的相对增益与源到 MCP 的距离呈线性增加,这与预测相符。在源到探测器的距离为 50cm 时,观察到的通量的最大相对增益为 18±1。

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