Department of Chemistry, Vanderbilt University, Nashville, Tennessee 37235, USA.
J Chem Phys. 2011 Feb 28;134(8):084301. doi: 10.1063/1.3555623.
The spectrum of I(2) is examined anew in the wavelength region 520-640 nm, where discrete absorption in the B-X transition is prominent. The spectrum is recorded with high quantitative precision at moderate resolution (0.1 nm) and is analyzed by least-squares spectral simulation, yielding the B-X electronic transition strength ∣μ(e)∣(2) with unprecedented precision (<2% relative standard error) over most of the studied region. The analysis also yields directly new estimates of the continuous absorption in this region, which support previous assessments of the A ← X transition but lower the C((1)Π(u)) ← X transition strength by 25%. The new analysis method is applicable to any situation where the discrete spectrum can be simulated reliably.
重新研究了 520-640nm 波长区域内的 I(2)光谱,在该区域中,B-X 跃迁的离散吸收非常明显。光谱以中等分辨率(0.1nm)记录,并通过最小二乘光谱模拟进行分析,在大部分研究区域内,以空前的精度(<2%的相对标准误差)得到 B-X 电子跃迁强度∣μ(e)∣(2)。该分析还直接得到了该区域连续吸收的新估计值,这支持了先前对 A←X 跃迁的评估,但将 C((1)Π(u))←X 跃迁强度降低了 25%。新的分析方法适用于任何可以可靠地模拟离散光谱的情况。