Pernice Wolfram H P, Schuck Carsten, Li Mo, Tang Hong X
Department of Electrical Engineering, Yale University, New Haven, CT 06511, USA.
Opt Express. 2011 Feb 14;19(4):3290-6. doi: 10.1364/OE.19.003290.
We describe measurement results of silicon photonic circuits at cryogenic temperatures. The interplay between optically induced heating and free carrier dynamics in nano-photonic ring resonators is investigated at temperatures down to 1.8 K. We find that the life-time of free carriers generated by two-photon absorption in silicon waveguides is reduced from 1.9 ns at room temperature to less than 100 ps below 10K. At the same time the thermal relaxation time is significantly elongated. Our work provides the first cryogenic measurement of ultra-short free-carrier lifetimes in silicon waveguides. The results further indicate that integrated optical chips can be easily thermo-optically stabilized at low temperatures.
我们描述了硅光子电路在低温下的测量结果。在低至1.8K的温度下，研究了纳米光子环形谐振器中光致加热与自由载流子动力学之间的相互作用。我们发现，硅波导中由双光子吸收产生的自由载流子寿命从室温下的1.9ns降低到10K以下时小于100ps。与此同时，热弛豫时间显著延长。我们的工作首次对硅波导中的超短自由载流子寿命进行了低温测量。结果进一步表明，集成光学芯片在低温下可以很容易地通过热光方式实现稳定。
