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利用三维聚焦离子束断层扫描技术对脆性绝缘陶瓷的亚表面损伤进行定量分析。

Quantification of subsurface damage in a brittle insulating ceramic by three-dimensional focused ion beam tomography.

机构信息

Department of Mechanical and Manufacturing Engineering, Trinity College Dublin, Dublin 2, Ireland.

出版信息

Microsc Microanal. 2011 Apr;17(2):240-5. doi: 10.1017/S1431927610094523. Epub 2011 Mar 4.

Abstract

In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.

摘要

在这项研究中,我们提出了一种全自动的方法来研究和重建高度绝缘材料中压痕下的三维裂纹结构。这项工作集中于长自动采集过程、试样的绝缘性质以及由于压痕导致原始裂纹最小化损伤所引起的问题。

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