Department of Metallurgical & Materials Engineering, The University of Alabama, 301 7th Avenue, 116 Houser Hall, Tuscaloosa, AL 35487-0202, USA.
Microsc Microanal. 2011 Jun;17(3):403-9. doi: 10.1017/S1431927611000146. Epub 2011 Apr 15.
Eight FePt thin film specimens of various thicknesses, compositions, and order parameters have been analyzed to determine the robustness and fidelity of multislice simulations in determining the chemical order parameter via electron diffraction (ED). The shape of the simulated curves depends significantly on the orientation and thickness of the specimen. The ED results are compared to kinematical scattering order parameters, from the same films, acquired from synchrotron X-ray diffraction (XRD). For the specimens analyzed with convergent beam electron diffraction conditions, the order parameter closely matched the order parameter as determined by the XRD methodology. However, the specimens analyzed by selected area electron diffraction conditions did not show good agreement. This has been attributed to substrate effects that hindered the ability to accurately quantify the intensity values of the superlattice and fundamental reflections.
已经分析了八个不同厚度、组成和有序参数的 FePt 薄膜样品，以确定通过电子衍射（ED）确定化学有序参数的多层模拟的稳健性和保真度。模拟曲线的形状取决于样品的取向和厚度。ED 结果与从同一样品获得的同步加速器 X 射线衍射（XRD）的运动学散射有序参数进行了比较。对于在会聚束电子衍射条件下分析的样品，有序参数与通过 XRD 方法确定的有序参数非常匹配。然而，在选区电子衍射条件下分析的样品则没有很好的一致性。这归因于基底效应，这阻碍了准确量化超晶格和基态反射强度值的能力。
