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使用基于高频超声换能器的手持式探头测量牙釉质厚度,以用于牙贴面放置程序中的潜在应用。

Enamel thickness measurement with a high frequency ultrasonic transducer-based hand-held probe for potential application in the dental veneer placing procedure.

作者信息

Ślak Bartosz, Ambroziak Andrzej, Strumban Emil, Maev Roman Gr

机构信息

The Institute for Diagnostic Imaging Research, University of Windsor, Windsor, Ontario, Canada.

出版信息

Acta Bioeng Biomech. 2011;13(1):65-70.

PMID:21500765
Abstract

This study presents a novel approach to measure the enamel thickness potentially applicable to the veneer placing procedure. All experiments have been carried out on the extracted human teeth, using a high frequency ultrasonic transducer (50 MHz, Sonix, Springfield, VA, USA). The enamel thickness measurement results obtained with high positional accuracy by a scanning acoustic microscope (Tessonics AM1103, Windsor, ON, Canada) were compared with the measurements conducted in a hand-held mode by using the same transducer placed in a custom fixture. Finally, to validate the ultrasonic measuring results, the samples were cut down the long axis to expose the cross-section. The enamel thickness was measured in several points along the selected part of the exposed cross-section by using an optical microscope (Stemi SV 11, Carl Zeiss AG, Jena, Germany). The values of the enamel thickness received by using the hand-held probe vs. the acoustic microscope were in close proximity (10% difference) and were also satisfactory close to the enamel thickness results obtained from the direct cross-sectional measurements (12% difference). The authors suggested a measuring procedure that allows avoiding errors related to the ultrasonic beam localization on the tooth surface. The high feasibility of the ultrasonic pulse-echo measurements in a hand-held mode was demonstrated.

摘要

本研究提出了一种测量牙釉质厚度的新方法,该方法可能适用于贴面放置程序。所有实验均在拔除的人类牙齿上进行,使用高频超声换能器(50 MHz,Sonix,美国弗吉尼亚州斯普林菲尔德)。将扫描声学显微镜(Tessonics AM1103,加拿大安大略省温莎)以高位置精度获得的牙釉质厚度测量结果与使用置于定制夹具中的同一换能器以手持模式进行的测量结果进行比较。最后,为了验证超声测量结果,将样本沿长轴切开以暴露横截面。使用光学显微镜(Stemi SV 11,德国耶拿卡尔蔡司股份公司)在暴露横截面的选定部分沿几个点测量牙釉质厚度。使用手持探头与声学显微镜获得的牙釉质厚度值非常接近(差异约10%),并且也与直接横截面测量获得的牙釉质厚度结果非常接近(差异约12%)。作者提出了一种测量程序,可避免与超声束在牙齿表面定位相关的误差。证明了手持模式下超声脉冲回波测量的高度可行性。

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