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压电多层致动器寿命测试。

Piezoelectric multilayer actuator life test.

机构信息

Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA.

出版信息

IEEE Trans Ultrason Ferroelectr Freq Control. 2011 Apr;58(4):820-8. doi: 10.1109/TUFFC.2011.1874.

Abstract

Potential NASA optical missions such as the Space Interferometer Mission require actuators for precision positioning to accuracies of the order of nanometers. Commercially available multilayer piezoelectric stack actuators are being considered for driving these precision mirror positioning mechanisms. These mechanisms have potential mission operational requirements that exceed 5 years for one mission life. To test the feasibility of using these commercial actuators for these applications and to determine their reliability and the redundancy requirements, a life test study was undertaken. The nominal actuator requirements for the most critical actuators on the Space Interferometry Mission (SIM) in terms of number of cycles was estimated from the Modulation Optics Mechanism (MOM) and Pathlength control Optics Mechanism (POM) and these requirements were used to define the study. At a nominal drive frequency of 250 Hz, one mission life is calculated to be 40 billion cycles. In this study, a set of commercial PZT stacks configured in a potential flight actuator configuration (pre-stressed to 18 MPa and bonded in flexures) were tested for up to 100 billion cycles. Each test flexure allowed for two sets of primary and redundant stacks to be mechanically connected in series. The tests were controlled using an automated software control and data acquisition system that set up the test parameters and monitored the waveform of the stack electrical current and voltage. The samples were driven between 0 and 20 V at 2000 Hz to accelerate the life test and mimic the voltage amplitude that is expected to be applied to the stacks during operation. During the life test, 10 primary stacks were driven and 10 redundant stacks, mechanically in series with the driven stacks, were open-circuited. The stroke determined from a strain gauge, the temperature and humidity in the chamber, and the temperature of each individual stack were recorded. Other properties of the stacks, including the displacement from a capacitance gap sensor and impedance spectra were measured at specific intervals. The average degradation in the stroke over the life test was found to be small (<3%) for the primary stacks and <4% for the redundant stacks. It was noted that about half of the stroke reduction occurred within the first 10 billion cycles. At the end of the life test, it was found that the actuator could recover about half of the lost stroke by applying a dc voltage of 100 V at room temperature. The data up to 100 billion cycles for these tests and the analysis of the experimental results are presented in this paper.

摘要

潜在的 NASA 光学任务,如太空干涉测量任务,需要精密定位的执行器,精度达到纳米级。商业上可用的多层压电堆叠执行器正被考虑用于驱动这些精密镜面定位机构。这些机构具有潜在的任务运行要求,超过一个任务寿命的 5 年。为了测试这些商用执行器在这些应用中的可行性,并确定它们的可靠性和冗余要求,进行了寿命测试研究。根据调制光学机构(MOM)和光程控制光学机构(POM)对太空干涉测量任务(SIM)上最关键执行器的名义执行器要求进行了估算,并使用这些要求来定义研究。在名义驱动频率为 250 Hz 的情况下,一个任务寿命被计算为 400 亿次循环。在这项研究中,一组配置为潜在飞行执行器配置的商用 PZT 堆叠(预加应力至 18 MPa 并在挠曲处粘合)进行了高达 1000 亿次循环的测试。每个测试挠曲允许两套主要和冗余堆叠机械串联连接。测试使用自动化软件控制和数据采集系统进行控制,该系统设置了测试参数并监测了堆叠电流和电压的波形。样品在 0 到 20 V 之间以 2000 Hz 的频率驱动,以加速寿命测试并模拟操作期间预期施加到堆叠上的电压幅度。在寿命测试期间,驱动了 10 个主堆叠,并将 10 个冗余堆叠(与驱动堆叠机械串联)开路。从应变计记录的行程、腔室内的温度和湿度以及每个堆叠的温度。在特定间隔测量了堆叠的其他特性,包括电容间隙传感器的位移和阻抗谱。发现主堆叠的行程平均退化在整个寿命测试中很小(<3%),冗余堆叠的退化小于 4%。注意到行程减少的一半发生在最初的 100 亿次循环内。在寿命测试结束时,发现执行器可以通过在室温下施加 100 V 的直流电压来恢复大约一半的丢失行程。本文介绍了这些测试的高达 1000 亿次循环的数据以及对实验结果的分析。

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