Scheller Maik
Fachbereich Physik, Philipps-Universität Marburg, Renthof 5, 35032 Marburg, Germany.
Opt Express. 2011 May 23;19(11):10647-55. doi: 10.1364/OE.19.010647.
Terahertz time domain spectroscopy allows for characterization of dielectrics even in cases where the samples thickness is unknown. However, a parameter extraction over a broad frequency range with simultaneous thickness determination is time consuming using conventional algorithms due to the large number of optimization steps. In this paper we present a novel method to extract the data. By employing a three dimensional optimization algorithm the calculation effort is significantly reduced while preserving the same accuracy level as conventional approaches. The presented method is even fast enough to be used in imaging applications.
太赫兹时域光谱技术即使在样品厚度未知的情况下也能对电介质进行表征。然而，由于优化步骤数量众多，使用传统算法在宽频率范围内进行参数提取并同时确定厚度非常耗时。在本文中，我们提出了一种提取数据的新方法。通过采用三维优化算法，计算量显著减少，同时保持与传统方法相同的精度水平。所提出的方法甚至足够快，可以用于成像应用。
