Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
ACS Nano. 2011 Jul 26;5(7):5683-91. doi: 10.1021/nn2013518. Epub 2011 Jun 22.
Applications of piezoresponse force microscopy and conductive atomic force microscopy to ferroelectric thin films necessitate understanding of the possible bias-induced electrochemical reactivity of oxide surfaces. These range from reversible ionic surface charging (possibly coupled to polarization) and vacancy and proton injection to partially reversible vacancy ordering, to irreversible electrochemical degradation of the film and bottom electrode. Here, the electrochemical phenomena induced by a biased tip are analyzed and both theoretical and experimental criteria for their identification are summarized.
压电力显微镜和导电原子力显微镜在铁电薄膜中的应用需要了解氧化物表面可能存在的偏压诱导的电化学活性。这些现象包括可逆的离子表面电荷（可能与极化相关）和空位及质子注入，部分可逆的空位有序化，以及薄膜和底电极的不可逆电化学降解。在此，我们分析了偏置针尖诱导的电化学现象，并总结了它们的理论和实验识别标准。
