Future Convergence Research Division, Korea Institute of Science and Technology, Cheongryang, Seoul, Korea.
Nanotechnology. 2011 Jul 22;22(29):295203. doi: 10.1088/0957-4484/22/29/295203. Epub 2011 Jun 20.
We present data, which were obtained before bending and after bending, for the electrical bistabilities, memory stabilities, and memory mechanisms of three-layer structured flexible bistable organic memory (BOM) devices, which were fabricated utilizing the ultrathin graphite sheets (UGS) sandwiched between insulating poly(methylmethacrylate) (PMMA) polymer layers. The UGS were formed by transferring UGS (about 30 layers) and using a simple spin-coating technique. Transmission electron microscopy (TEM) measurements were performed to investigate the microstructural properties of the PMMA/UGS/PMMA films. Current-voltage (I-V) measurements were carried out to investigate the electrical properties of the BOM devices containing the UGS embedded in the PMMA polymer. Current-time (I-t) and current-cycle measurements under flat and bent conditions were performed to investigate the memory stabilities of the BOM devices. The memory characteristics of the BOM maintained similar device efficiencies after bending and were stable during repeated bendings of the BOM devices. The mechanisms for these characteristics of the fabricated BOM are described on the basis of the I-V results.
我们展示了三层结构柔性双稳有机存储器(BOM)器件的电双稳性、存储稳定性和存储机制的数据,这些数据是在弯曲前后获得的,该 BOM 器件采用夹在绝缘聚甲基丙烯酸甲酯(PMMA)聚合物层之间的超薄石墨片(UGS)制造。UGS 通过转移 UGS(约 30 层)并使用简单的旋涂技术形成。通过透射电子显微镜(TEM)测量来研究 PMMA/UGS/PMMA 薄膜的微观结构特性。进行电流-电压(I-V)测量以研究包含嵌入 PMMA 聚合物中的 UGS 的 BOM 器件的电性能。在平坦和弯曲条件下进行电流-时间(I-t)和电流循环测量,以研究 BOM 器件的存储稳定性。BOM 的存储特性在弯曲后保持类似的器件效率,并且在 BOM 器件的重复弯曲过程中稳定。根据 I-V 结果描述了所制造的 BOM 的这些特性的机制。