Wang Yanghong, Thomas Dan, Zhang Ping, Yokota Hiroki, Yang Lianxiang
Department of Mechanical Engineering, Oakland University, Rochester, MI 48309, USA.
Mater Eval. 2008 May;66(5):507-512.
Digital Speckle Pattern Interferometry (DSPI), originally known as electronic speckle pattern interferometry (ESPI), is an interferometry based method applicable for conducting 3-dimensional whole field strain characterization. The present DSPI systems are suited for analyzing a relatively simple surface (e.g., a plane surface). However, few existing systems are able to accurately determine strain distributions on a surface with significant contour complexity. Here, we present development of a novel DSPI system that allows strain characterization of a sample with a complex surface. In the described DSPI system, deformations and contours as well as an absolute phase value are determined. Furthermore, variations in measurement sensitivity are considered. We describe a principle and methodology using two examples in the area of mechanical engineering and biomedical engineering, and discuss potential usages and future directions.
数字散斑图案干涉测量法（DSPI），最初称为电子散斑图案干涉测量法（ESPI），是一种基于干涉测量的方法，适用于进行三维全场应变表征。目前的DSPI系统适用于分析相对简单的表面（例如平面）。然而，现有的系统很少能够准确确定具有显著轮廓复杂性的表面上的应变分布。在此，我们展示了一种新型DSPI系统的开发，该系统能够对具有复杂表面的样品进行应变表征。在所描述的DSPI系统中，确定了变形、轮廓以及绝对相位值。此外，还考虑了测量灵敏度的变化。我们通过机械工程和生物医学工程领域的两个例子描述了原理和方法，并讨论了潜在用途和未来方向。
