Knapp P F, Pikuz S A, Shelkovenko T A, Hammer D A, Hansen S B
Laboratory of Plasma Studies, Cornell University, 439 Rhodes Hall, Ithaca, New York 14853, USA.
Rev Sci Instrum. 2011 Jun;82(6):063501. doi: 10.1063/1.3592582.
We present here the use of absorption spectroscopy of the continuum radiation from x-pinch-produced point x-ray sources as a diagnostic to investigate the properties of aluminum plasmas created by pulsed power machines. This technique is being developed to determine the charge state, temperature, and density as a function of time and space under conditions that are inaccessible to x-ray emission spectroscopic diagnostics. The apparatus and its characterization are described, and the spectrometer dispersion, magnification, and resolution are calculated and compared with experimental results. Spectral resolution of about 5000 and spatial resolution of about 20 μm are demonstrated. This spectral resolution is the highest available to date in an absorption experiment. The beneficial properties of the x-pinch x-ray source as the backlighter for this diagnostic are the small source size (<5 μm), smooth continuum radiation, and short pulse duration (<0.1 ns). Results from a closely spaced (1 mm) exploding wire pair are shown and the general features are discussed.
我们在此介绍利用对X射线 pinch产生的点X射线源的连续辐射进行吸收光谱分析，作为一种诊断手段来研究脉冲功率机器产生的铝等离子体的特性。正在开发这项技术，以便在X射线发射光谱诊断无法企及的条件下，确定电荷态、温度和密度随时间和空间的变化。描述了该装置及其特性，并计算了光谱仪的色散、放大率和分辨率，并与实验结果进行了比较。展示了约5000的光谱分辨率和约20μm的空间分辨率。这种光谱分辨率是迄今为止吸收实验中可获得的最高分辨率。X射线pinch X射线源作为这种诊断的背光源的有益特性是源尺寸小（<5μm）、连续辐射平滑且脉冲持续时间短（<0.1 ns）。展示了间距紧密（1 mm）的爆炸丝对的结果并讨论了一般特征。
