Optoelectronics Research Centre, University of Southampton, Southampton SO17 1BJ, UK.
Opt Lett. 2011 Jul 1;36(13):2480-2. doi: 10.1364/OL.36.002480.
We investigate the surface roughness of polycrystalline silicon core optical fibers fabricated using a high-pressure chemical deposition technique. By measuring the optical transmission of two fibers with different core sizes, we will show that scattering from the core-cladding interface has a negligible effect on the losses. A Zemetrics ZeScope three-dimensional optical profiler has been used to directly measure the surface of the core material, confirming a roughness of only ~0.1 nm. The ability to fabricate low-loss polysilicon optical fibers with ultrasmooth cores scalable to submicrometer dimensions should establish their use in a range of nonlinear optical applications.
我们研究了使用高压化学沉积技术制造的多晶硅芯光纤的表面粗糙度。通过测量两根具有不同芯径的光纤的光传输，我们将表明芯-包层界面的散射对损耗的影响可以忽略不计。Zemetrics ZeScope 三维光学轮廓仪已被用于直接测量芯材的表面，证实其粗糙度仅为~0.1nm。能够制造具有亚微米尺寸可扩展性的低损耗多晶硅光纤，其超光滑芯应该能够在一系列非线性光学应用中得到应用。
