Department of Applied Chemistry & Bioengineering, Graduate School of Engineering, Osaka City University, Sumiyoshi-ku, Osaka, Japan.
Anal Chem. 2011 Aug 15;83(16):6389-94. doi: 10.1021/ac201395u. Epub 2011 Jul 27.
A new wavelength-dispersive X-ray fluorescence (WD-XRF) imaging spectrometer equipped with a two-dimensional X-ray detector was developed in the laboratory. Straight polycapillary optics was applied instead of a soller slit, which is used in conventional WD-XRF spectrometers. X-rays were guided through the straight polycapillary to the exit of the optics by X-ray external total reflections. X-ray fluorescence was dispersed by an analyzing crystal (LiF(200)), keeping the information of elemental distribution on the surface of the sample. The energy resolution of the developed spectrometer was 130-152 eV at the Zn Kα peak. X-ray elemental images of Cu Kα and Ni Kα were successfully obtained by an X-ray CCD detector at the corresponding diffraction angles. The analytical performance of this technique, and further improvements are discussed.
实验室研制了一种新型波长色散 X 射线荧光（WD-XRF）成像光谱仪，配备二维 X 射线探测器。直型多晶光学纤维代替传统 WD-XRF 光谱仪中的索拉狭缝，用于引导 X 射线。X 射线通过 X 射线外全反射穿过直型多晶光学纤维，从光学纤维的出口射出。X 射线荧光通过分析晶体（LiF(200)）进行色散，保留了样品表面元素分布的信息。在 Zn Kα 峰处，开发的光谱仪的能量分辨率为 130-152eV。通过 X 射线 CCD 探测器在相应的衍射角处成功获得了 Cu Kα 和 Ni Kα 的 X 射线元素图像。讨论了该技术的分析性能及其进一步改进。
