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用 Kelvin 探针力显微镜测定受光有机施主/受主异质结中的准费米能级。

Determination of quasi-Fermi levels across illuminated organic donor/acceptor heterojunctions by Kelvin probe force microscopy.

机构信息

Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, 55455, United States.

出版信息

J Am Chem Soc. 2011 Sep 7;133(35):13802-5. doi: 10.1021/ja2034574. Epub 2011 Aug 12.

Abstract

Using Kelvin probe force microscopy (KFM), we have measured the electrochemical potentials across indium tin oxide/organic and donor/acceptor heterojunctions in the dark and under illumination with white light. We have found that the photovoltage generated across these heterojunctions is strongly correlated with the difference between the respective HOMO and LUMO levels of the donor and acceptor and also very closely approximates measured open-circuit voltages in completed solar cells. These results imply that KFM tracks the Fermi level positions within the donor and acceptor layers under photoexcitation. Overall, these results demonstrate the utility of KFM for understanding potential profiles across active layers in planar-heterojunction organic solar cells.

摘要

使用 Kelvin 探针力显微镜 (KFM),我们在黑暗中和在白光照射下测量了氧化铟锡/有机和施主/受主异质结的电化学势。我们发现,这些异质结产生的光电压与施主和受主各自的 HOMO 和 LUMO 能级之间的差异强烈相关,并且非常接近在完整的太阳能电池中测量到的开路电压。这些结果表明,KFM 在光激发下跟踪施主和受主层中的费米能级位置。总的来说,这些结果表明 KFM 可用于理解平面异质结有机太阳能电池中活性层的势垒分布。

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