Materials Science and Engineering Program, University of California, San Diego, La Jolla, California 92093, USA.
J Chem Phys. 2011 Aug 7;135(5):054705. doi: 10.1063/1.3621672.
The direct reaction of trimethylaluminum (TMA) on a Ge(100) surface and the effects of monolayer H(2)O pre-dosing were investigated using ultrahigh vacuum techniques, such as scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS), and x-ray photoelectron spectroscopy (XPS), and density functional theory (DFT). At room temperature (RT), a saturation TMA dose produced 0.8 monolayers (ML) of semi-ordered species on a Ge(100) surface due to the dissociative chemisorption of TMA. STS confirmed the chemisorption of TMA passivated the bandgap states due to dangling bonds. By annealing the TMA-dosed Ge surface, the STM observed coverage of TMA sites decreased to 0.4 ML at 250 °C, and to 0.15 ML at 450 °C. XPS analysis showed that only carbon content was reduced during annealing, while the Al coverage was maintained at 0.15 ML, consistent with the desorption of methyl (-CH(3)) groups from the TMA adsorbates. Conversely, saturation TMA dosing at RT on the monolayer H(2)O pre-dosed Ge(100) surface followed by annealing at 200 °C formed a layer of Ge-O-Al bonds with an Al coverage a factor of two greater than the TMA only dosed Ge(100), consistent with Ge-OH activation of TMA chemisorption and Ge-H blocking of CH(3) chemisorption. The DFT shows that the reaction of TMA has lower activation energy and is more exothermic on Ge-OH than Ge-H sites. It is proposed that the H(2)O pre-dosing enhances the concentration of adsorbed Al and forms thermally stable Ge-O-Al bonds along the Ge dimer row which could serve as a nearly ideal atomic layer deposition nucleation layer on Ge(100) surface.
采用超高真空技术,如扫描隧道显微镜(STM)、扫描隧道谱(STS)和 X 射线光电子能谱(XPS)以及密度泛函理论(DFT),研究了三甲基铝(TMA)与 Ge(100)表面的直接反应以及单层 H(2)O 预吸附的影响。在室温下(RT),由于 TMA 的解离化学吸附,一个饱和的 TMA 剂量在 Ge(100)表面产生了 0.8 单层(ML)的半有序物种。STS 证实 TMA 的化学吸附由于悬空键而钝化了带隙态。通过对 TMA 剂量处理的 Ge 表面进行退火,STM 观察到 TMA 位的覆盖率在 250°C 时降至 0.4 ML,在 450°C 时降至 0.15 ML。XPS 分析表明,只有在退火过程中碳含量降低,而 Al 覆盖率保持在 0.15 ML,这与 TMA 吸附物中甲基(-CH(3))基团的脱附一致。相反,在室温下对单层 H(2)O 预吸附的 Ge(100)表面进行饱和 TMA 剂量处理,然后在 200°C 下退火,形成了一层 Ge-O-Al 键,其 Al 覆盖率是仅 TMA 剂量处理的 Ge(100)的两倍,这与 TMA 化学吸附的 Ge-OH 活化和 Ge-H 阻断 CH(3)化学吸附一致。DFT 表明,TMA 的反应在 Ge-OH 上的活化能更低,放热量更大。据推测,H(2)O 预吸附剂提高了吸附 Al 的浓度,并在 Ge 二聚体行上形成了热稳定的 Ge-O-Al 键,这可以作为 Ge(100)表面几乎理想的原子层沉积形核层。