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三甲基铝在清洁和 H2O 功能化 Ge(100)表面成核的原子成像。

Atomic imaging of nucleation of trimethylaluminum on clean and H2O functionalized Ge(100) surfaces.

机构信息

Materials Science and Engineering Program, University of California, San Diego, La Jolla, California 92093, USA.

出版信息

J Chem Phys. 2011 Aug 7;135(5):054705. doi: 10.1063/1.3621672.

Abstract

The direct reaction of trimethylaluminum (TMA) on a Ge(100) surface and the effects of monolayer H(2)O pre-dosing were investigated using ultrahigh vacuum techniques, such as scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS), and x-ray photoelectron spectroscopy (XPS), and density functional theory (DFT). At room temperature (RT), a saturation TMA dose produced 0.8 monolayers (ML) of semi-ordered species on a Ge(100) surface due to the dissociative chemisorption of TMA. STS confirmed the chemisorption of TMA passivated the bandgap states due to dangling bonds. By annealing the TMA-dosed Ge surface, the STM observed coverage of TMA sites decreased to 0.4 ML at 250 °C, and to 0.15 ML at 450 °C. XPS analysis showed that only carbon content was reduced during annealing, while the Al coverage was maintained at 0.15 ML, consistent with the desorption of methyl (-CH(3)) groups from the TMA adsorbates. Conversely, saturation TMA dosing at RT on the monolayer H(2)O pre-dosed Ge(100) surface followed by annealing at 200 °C formed a layer of Ge-O-Al bonds with an Al coverage a factor of two greater than the TMA only dosed Ge(100), consistent with Ge-OH activation of TMA chemisorption and Ge-H blocking of CH(3) chemisorption. The DFT shows that the reaction of TMA has lower activation energy and is more exothermic on Ge-OH than Ge-H sites. It is proposed that the H(2)O pre-dosing enhances the concentration of adsorbed Al and forms thermally stable Ge-O-Al bonds along the Ge dimer row which could serve as a nearly ideal atomic layer deposition nucleation layer on Ge(100) surface.

摘要

采用超高真空技术,如扫描隧道显微镜(STM)、扫描隧道谱(STS)和 X 射线光电子能谱(XPS)以及密度泛函理论(DFT),研究了三甲基铝(TMA)与 Ge(100)表面的直接反应以及单层 H(2)O 预吸附的影响。在室温下(RT),由于 TMA 的解离化学吸附,一个饱和的 TMA 剂量在 Ge(100)表面产生了 0.8 单层(ML)的半有序物种。STS 证实 TMA 的化学吸附由于悬空键而钝化了带隙态。通过对 TMA 剂量处理的 Ge 表面进行退火,STM 观察到 TMA 位的覆盖率在 250°C 时降至 0.4 ML,在 450°C 时降至 0.15 ML。XPS 分析表明,只有在退火过程中碳含量降低,而 Al 覆盖率保持在 0.15 ML,这与 TMA 吸附物中甲基(-CH(3))基团的脱附一致。相反,在室温下对单层 H(2)O 预吸附的 Ge(100)表面进行饱和 TMA 剂量处理,然后在 200°C 下退火,形成了一层 Ge-O-Al 键,其 Al 覆盖率是仅 TMA 剂量处理的 Ge(100)的两倍,这与 TMA 化学吸附的 Ge-OH 活化和 Ge-H 阻断 CH(3)化学吸附一致。DFT 表明,TMA 的反应在 Ge-OH 上的活化能更低,放热量更大。据推测,H(2)O 预吸附剂提高了吸附 Al 的浓度,并在 Ge 二聚体行上形成了热稳定的 Ge-O-Al 键,这可以作为 Ge(100)表面几乎理想的原子层沉积形核层。

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