Image Processing Systems Institute of the Russian Academy of Sciences, 151 Molodogvardeyskaya Street, Samara 443001, Russia.
Opt Lett. 2011 Aug 15;36(16):3100-2. doi: 10.1364/OL.36.003100.
Using a near-field scanning microscope (NT-MDT) with a 100 nm aperture cantilever held 1 μm apart from a microaxicon of diameter 14 μm and period 800 nm, we measure a focal spot resulting from the illumination by a linearly polarized laser light of wavelength λ=532 nm, with its FWHM being equal to 0.58λ, and the depth of focus being 5.6λ. The rms deviation of the focal spot intensity from the calculated value is 6%. The focus intensity is five times larger than the maximal illumination beam intensity.
使用带有 100nm 孔径悬臂的近场扫描显微镜（NT-MDT），将其与直径为 14μm、周期为 800nm 的微棱锥保持 1μm 的距离，我们测量了由波长为λ=532nm 的线偏振激光照射产生的焦点光斑，其半高全宽等于 0.58λ，焦点深度为 5.6λ。焦点强度的均方根偏差与计算值相差 6%。焦点强度是最大照明光束强度的五倍。
