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使用直流电导测量跟踪量子点接触中一维子带边缘的能量。

Tracking the energies of one-dimensional sub-band edges in quantum point contacts using dc conductance measurements.

机构信息

School of Physics, University of New South Wales, Sydney, NSW, Australia.

出版信息

J Phys Condens Matter. 2011 Sep 14;23(36):362201. doi: 10.1088/0953-8984/23/36/362201. Epub 2011 Aug 22.

Abstract

The semiconductor quantum point contact has long been a focal point for studies of one-dimensional (1D) electron transport. Their electrical properties are typically studied using ac conductance methods, but recent work has shown that the dc conductance can be used to obtain additional information, with a density-dependent Landé effective g-factor recently reported (Chen et al 2009 Phys. Rev. B 79 081301). We discuss previous dc conductance measurements of quantum point contacts, demonstrating how valuable additional information can be extracted from the data. We provide a comprehensive and general framework for dc conductance measurements that provides a path to improving the accuracy of existing data and obtaining useful additional data. A key aspect is that dc conductance measurements can be used to map the energy of the 1D sub-band edges directly, giving new insight into the physics that takes place as the spin-split 1D sub-bands populate. Through a re-analysis of the data obtained by Chen et al, we obtain two findings. The first is that the 2↓ sub-band edge closely tracks the source chemical potential when it first begins populating before dropping more rapidly in energy. The second is that the 2↑ sub-band populates more rapidly as the sub-band edge approaches the drain potential. This second finding suggests that the spin-gap may stop opening, or even begin to close again, as the 2↑ sub-band continues populating, consistent with recent theoretical calculations and experimental studies.

摘要

半导体量子点接触长期以来一直是一维(1D)电子输运研究的焦点。它们的电学性质通常使用交流电导方法进行研究,但最近的工作表明,直流电导也可以用来获得额外的信息,最近报道了一个与密度有关的朗德有效 g 因子(Chen 等人,2009 年,物理评论 B79,081301)。我们讨论了以前的量子点接触的直流电导测量,展示了如何从数据中提取有价值的额外信息。我们提供了一个全面而通用的直流电导测量框架,为提高现有数据的准确性和获取有用的附加数据提供了途径。一个关键方面是,直流电导测量可以用来直接绘制 1D 子带边缘的能量,从而深入了解自旋分裂的 1D 子带填充时发生的物理现象。通过对 Chen 等人获得的数据进行重新分析,我们得出了两个发现。第一个发现是,当 2↓子带边缘首次开始填充时,它与源化学势密切相关,然后能量迅速下降。第二个发现是,随着子带边缘接近漏极电势,2↑子带更快地填充。第二个发现表明,随着 2↑子带的继续填充,自旋能隙可能停止打开,甚至开始再次关闭,这与最近的理论计算和实验研究一致。

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