Synchrotron Soleil, L'Orme des Merisiers, Saint Aubin, Gif sur Yvette, France.
J Synchrotron Radiat. 2011 Sep;18(Pt 5):761-4. doi: 10.1107/S0909049511023119. Epub 2011 Jul 8.
Carbon contamination is a general problem of under-vacuum optics submitted to high fluence. In soft X-ray beamlines carbon deposit on optics is known to absorb and scatter radiation close to the C K-edge (280 eV), forbidding effective measurements in this spectral region. Here the observation of strong reflectivity losses is reported related to carbon deposition at much higher energies around 1000 eV, where carbon absorptivity is small. It is shown that the observed effect can be modelled as a destructive interference from a homogeneous carbon thin film.
碳污染是在高通量下使用低真空光学元件的一个普遍问题。在软 X 射线光束线中，已知光学元件上的碳沉积物会吸收和散射接近 C K 边缘（280 eV）的辐射，从而禁止在该光谱区域进行有效的测量。本文报道了在能量远高于 1000 eV（此时碳吸收率很小）的情况下，由于碳沉积而导致的强烈反射率损失的观察结果。结果表明，观察到的效应可以用均匀的碳薄膜的相消干涉来建模。
