School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD, UK.
Chem Commun (Camb). 2011 Oct 14;47(38):10575-7. doi: 10.1039/c1cc14147c. Epub 2011 Aug 24.
We measure the short-range chemical force between a silicon-terminated tip and individual adsorbed C(60) molecules using frequency modulation atomic force microscopy. The interaction with an adsorbed fullerene is sufficiently strong to drive significant atomic rearrangement of tip structures.
我们使用频率调制原子力显微镜测量了硅尖端和单个吸附的 C(60)分子之间的短程化学力。与吸附的富勒烯的相互作用足够强，足以导致尖端结构的显著原子重排。
