Kim Do-Hyun, Shi Dexiu, Ilev Ilko K
US Food and Drug Administration, Silver Spring, Maryland 20993, USA. do‐
Appl Opt. 2011 Sep 10;50(26):5163-8. doi: 10.1364/AO.50.005163.
We present a simple method for measuring the effective focal length without determining the location of principle plane of the lens. The method is based on the measurement of confocal backreflection axial responses from the front and back surfaces of a reference plate with known refractive index and thickness. We proved the concept by measuring the effective focal lengths of thin singlet lenses and complex microscope objectives. The theoretical limit of measurement precision varies depending on the numerical aperture of the lens. This method can provide an alternative focal length measurement method for complex lenses or lenses that are permanently attached to other structures. Measurement errors were analyzed theoretically and improvements in measurement accuracy were discussed.
我们提出了一种无需确定透镜主平面位置即可测量有效焦距的简单方法。该方法基于对具有已知折射率和厚度的参考板的前表面和后表面的共焦背反射轴向响应的测量。我们通过测量薄单透镜和复杂显微镜物镜的有效焦距来验证这一概念。测量精度的理论极限因透镜的数值孔径而异。该方法可为复杂透镜或永久附着于其他结构的透镜提供一种替代的焦距测量方法。从理论上分析了测量误差,并讨论了测量精度的提高。