Kim Seung Hwan, Lee Seoung Hun, Lim Jae In, Kim Kyong Hon
Inha University, 253 Yonghyun-dong, Nam-gu, Incheon 402-751, Korea.
Appl Opt. 2010 Feb 10;49(5):910-4. doi: 10.1364/AO.49.000910.
We report a simple method of measuring the absolute values of the phase refractive index of an optical material of a flat plate shape over a wide spectral range at a single measurement run. A white-light interferometric technique with angle rotation of the optical plate sample located in one of the interferometer arms was used in this method. The validity of this method was proved by measuring the absolute phase refractive indices of flat plate samples of fused silica and BK7, and by comparing them with calculated values from their well-known Sellmeier dispersion formulas. The accuracy of this refractive index measurement method was within 0.002, which can be further improved by enhancing the angle measurement accuracy of the angle rotating stage used in this method.
我们报告了一种简单的方法，可在单次测量过程中，在宽光谱范围内测量平板状光学材料的相折射率绝对值。该方法采用了白光干涉技术，其中位于干涉仪臂之一中的光学平板样品进行角度旋转。通过测量熔融石英和BK7平板样品的绝对相折射率，并将其与根据其著名的Sellmeier色散公式计算的值进行比较，证明了该方法的有效性。这种折射率测量方法的精度在0.002以内，通过提高该方法中使用的角度旋转台的角度测量精度可进一步提高。
