一种用于测量高达70 GHz薄膜的宽带铁磁共振光谱仪。

A broadband ferromagnetic resonance spectrometer to measure thin films up to 70 GHz.

作者信息

Harward I, O'Keevan T, Hutchison A, Zagorodnii V, Celinski Z

机构信息

Center for Magnetism and Magnetic Nanostructures, University of Colorado Colorado Springs, 1420 Austin Bluffs Parkway, Colorado Springs, Colorado 80918, USA.

出版信息

Rev Sci Instrum. 2011 Sep;82(9):095115. doi: 10.1063/1.3641319.

DOI:10.1063/1.3641319

PMID:21974627

Abstract

We report the development of a broadband ferromagnetic resonance (FMR) system operating in the frequency range from 10 MHz to 70 GHz using a closed-cycle He refrigeration system for measurements of thin films and micron/nano structures. The system is capable of carrying out measurements in frequency and field domain. Using two coplanar waveguides, it is capable of simultaneously measuring two samples in the out of plane and in plane FMR geometries. The system operates in the temperature range of 27-350 K and is sensitive to less than one atomic monolayer of a single crystal Fe film.

摘要

我们报告了一种宽带铁磁共振（FMR）系统的开发情况，该系统使用闭环氦制冷系统，工作频率范围为10 MHz至70 GHz，用于测量薄膜和微米/纳米结构。该系统能够在频率和场域进行测量。使用两个共面波导，它能够同时在面外和面内FMR几何结构中测量两个样品。该系统在27 - 350 K的温度范围内运行，对单晶铁膜的敏感度低于一个原子单层。