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基于倾斜狭缝-凹槽等离子体干涉仪的非光谱折射纳米传感器。

Non-spectroscopic refractometric nanosensor based on a tilted slit-groove plasmonic interferometer.

作者信息

Li Xiaowei, Tan Qiaofeng, Bai Benfeng, Jin Guofan

机构信息

State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments, Tsinghua University, Beijing 100084, China.

出版信息

Opt Express. 2011 Oct 10;19(21):20691-703. doi: 10.1364/OE.19.020691.

Abstract

Plasmonic nanosensors are promising for chip-based refractometric detections, most of which are based on spectroscopic monitoring of surface plasmon resonance. Here, we propose a simple non-spectroscopic refractometric sensing scheme based on a plasmonic interferometer integrating a metallic groove array and a tilted nanoslit. Owing to the interference of the directly transmitted light from the nanoslit and that mediated by the surface plasmon polaritons launched from the groove array, high-contrast intensity fringe can be detected under the illumination of monochromatic light. By inspecting the spatial shift of the interference fringe, the refractive index change of the cover analyte can be derived. In our experiment, the interferometer shows a sensitivity up to 5 × 10³ μm/RIU and a figure of merit as high as 250. This sensor shows great potential for low-cost, portable, and high-throughput sensing applications due to its simple, robust, and non-spectroscopic scheme.

摘要

表面等离子体纳米传感器在基于芯片的折射检测方面很有前景,其中大多数基于表面等离子体共振的光谱监测。在此,我们提出一种基于表面等离子体干涉仪的简单非光谱折射传感方案,该干涉仪集成了金属凹槽阵列和倾斜纳米狭缝。由于纳米狭缝直接透射的光与由凹槽阵列激发的表面等离子体激元介导的光之间的干涉,在单色光照射下可以检测到高对比度的强度条纹。通过检查干涉条纹的空间位移,可以得出覆盖分析物的折射率变化。在我们的实验中,该干涉仪显示出高达5×10³μm/RIU的灵敏度和高达250的品质因数。由于其简单、稳健和非光谱的方案,该传感器在低成本、便携式和高通量传感应用中显示出巨大潜力。

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