CEA, DEN, SRMA, F-91191 Gif-sur Yvette Cedex, France.
J Phys Condens Matter. 2011 Nov 16;23(45):455901. doi: 10.1088/0953-8984/23/45/455901. Epub 2011 Oct 21.
Yttria-stabilized zirconia (ZrO2 : Y3+) single crystals (with 9.5 mol% Y2O3) were irradiated with x-rays and α particles. Thermally stimulated luminescence (TSL) data show a main broad peak centred at ∼500-550 K in the glow curves of all irradiated samples. The TSL peak maximum temperature is consistent with the characteristic recovery temperature (∼450 K) of colour centres (T centres) deduced from isochronal annealing curves measured by electron paramagnetic resonance (EPR) spectroscopy. However, the trap-depth energies (ranging between 0.8 and 1.2 eV) deduced from the initial rise of partially cleaned TSL peaks (and from a rough approximation using Urbach's formula) are much larger than the activation energies for defect recovery of 0.3 eV deduced from the EPR data. A second TSL peak centred at ∼350-450 K found in freshly irradiated samples is seen to decay substantially in aged samples. The processes involved in TSL are discussed in relation to the defect annealing processes, and available defect-level energy and TSL data.
氧化钇稳定的氧化锆（ZrO2:Y3+）单晶体（含 9.5 摩尔%的 Y2O3）经 X 射线和α粒子辐照。热激励发光（TSL）数据显示，所有辐照样品的发光曲线中都有一个中心在约 500-550 K 的主宽峰。TSL 峰的最大温度与电子顺磁共振（EPR）光谱测量的色心（T 心）的特征恢复温度（约 450 K）一致。然而，从部分清洗 TSL 峰的初始上升中推断出的陷阱深度能量（在 0.8 和 1.2 eV 之间）以及使用 Urbach 公式的粗略近似值）远大于从 EPR 数据推断出的缺陷恢复的激活能 0.3 eV。在新辐照的样品中发现的中心位于约 350-450 K 的第二个 TSL 峰在老化样品中明显衰减。讨论了 TSL 涉及的过程与缺陷退火过程以及可用的缺陷能级和 TSL 数据的关系。
