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钛酸铋钠锆陶瓷的晶体结构与电学性能

Crystal structure and electrical properties of bismuth sodium titanate zirconate ceramics.

作者信息

Rachakom Ampika, Jaiban Panupong, Jiansirisomboon Sukanda, Watcharapasorn Anucha

机构信息

Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai, 50200, Thailand.

出版信息

Nanoscale Res Lett. 2012 Jan 5;7(1):57. doi: 10.1186/1556-276X-7-57.

Abstract

Lead-free bismuth sodium titanate zirconate (Bi0.5Na0.5Ti1-xZrxO3 where x = 0.20, 0.35, 0.40, 0.45, 0.60, and 0.80 mole fraction) [BNTZ] ceramics were successfully prepared using the conventional mixed-oxide method. The samples were sintered for 2 h at temperatures lower than 1,000°C. The density of the BNTZ samples was at least 95% of the theoretical values. The scanning electron microscopy micrographs showed that small grains were embedded between large grains, causing a relatively wide grain size distribution. The density and grain size increased with increasing Zr concentration. A peak shift in X-ray diffraction patterns as well as the disappearance of several hkl reflections indicated some significant crystal-structure changes in these materials. Preliminary crystal-structure analysis indicated the existence of phase transition from a rhombohedral to an orthorhombic structure. The dielectric and ferroelectric properties were also found to correlate well with the observed phase transition.

摘要

采用传统混合氧化物法成功制备了无铅钛酸铋钠锆(Bi0.5Na0.5Ti1-xZrxO3,其中x = 0.20、0.35、0.40、0.45、0.60和0.80摩尔分数)[BNTZ]陶瓷。样品在低于1000°C的温度下烧结2小时。BNTZ样品的密度至少为理论值的95%。扫描电子显微镜照片显示,小晶粒嵌入大晶粒之间,导致晶粒尺寸分布相对较宽。密度和晶粒尺寸随Zr浓度的增加而增大。X射线衍射图谱中的峰位移以及几个hkl反射的消失表明这些材料存在一些显著的晶体结构变化。初步晶体结构分析表明存在从菱面体结构到正交结构的相变。还发现介电和铁电性能与观察到的相变密切相关。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/465b/3264495/ef72061e3a1b/1556-276X-7-57-1.jpg

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