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通过图像反转干涉测量法提高微观物体的分辨率。

Enhanced resolution of microscopic objects by image inversion interferometry.

作者信息

Weigel D, Foerster R, Babovsky H, Kiessling A, Kowarschik R

机构信息

Institute of Applied Optics, Friedrich-Schiller-University Jena, Jena, Germany.

出版信息

Opt Express. 2011 Dec 19;19(27):26451-62. doi: 10.1364/OE.19.026451.

Abstract

We demonstrate in experiment that the resolution of a conventional light microscope can be enhanced by 26% with the help of an image inverting interferometer. In order to prove this statement, we measured the point spread function of the system as well as the resolution of two-point objects. Additionally, the contrast transmission function of the interferometric setup was measured and compared to the results gained with a conventional wide-field microscope. Using the interferometric system, the spatial frequencies near the cutoff-frequency were far better transmitted than by the conventional microscope. Finally, we demonstrate the improved resolution with the help of images of two-dimensional structures.

摘要

我们在实验中证明,借助图像倒置干涉仪,传统光学显微镜的分辨率可提高26%。为了证明这一说法,我们测量了系统的点扩散函数以及两点物体的分辨率。此外,还测量了干涉装置的对比度传递函数,并与传统宽视场显微镜获得的结果进行了比较。使用干涉系统时,截止频率附近的空间频率比传统显微镜的传输效果要好得多。最后,我们借助二维结构的图像展示了提高后的分辨率。

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