Chen Wenxue, Li Haohao, Zhang Shulian, Long Xingwu
Department of Optoelectronic Engineering, College of Opto-electronic Science and Engineering, National University of Defense Technology, Hunan, China.
Rev Sci Instrum. 2012 Jan;83(1):013101. doi: 10.1063/1.3673641.
Polarization flipping accompanying with intensity transfer between two eigenstates of one laser mode happens when waveplate is placed in external cavity. The position of polarization flipping of two eigenstates is a function of phase retardation of waveplate. Phase retardation of waveplate is measured through analyzing the position of polarization flipping of two eigenstates. The measurement accuracy of phase retardation is 0.22°. A new structure of optical cement tray which can eliminate stress birefringence from optical cement process is invented. The accuracy of waveplate manufacture can be improved greatly based on the work of this article.
当波片置于外腔中时,一个激光模式的两个本征态之间会发生伴随着强度转移的偏振翻转。两个本征态的偏振翻转位置是波片相位延迟的函数。通过分析两个本征态的偏振翻转位置来测量波片的相位延迟。相位延迟的测量精度为0.22°。发明了一种新型光学胶盘结构,可消除光学胶合过程中的应力双折射。基于本文的工作,波片制造的精度可得到大幅提高。