Fritz-Haber-Institute of the Max-Planck-Society, Department of Chemical Physics, Berlin, Germany.
J Phys Condens Matter. 2012 Feb 29;24(8):084007. doi: 10.1088/0953-8984/24/8/084007. Epub 2012 Feb 7.
Noncontact atomic force microscopy (NC-AFM) has been performed on an aluminum oxide film grown on NiAl(110) in ultrahigh vacuum (UHV) at low temperature (5 K). Results reproduce the topography of the structural model, unlike scanning tunnelling microscopy (STM) images. Equipped with this extraordinary contrast the network of extended defects, which stems from domain boundaries intersecting the film surface, can be analysed in atomic detail. The knowledge of occurring surface structures opens up the opportunity to determine adsorption sites of individual adsorbates on the alumina film. The level of difficulty for such imaging depends on the imaging characteristics of the substrate and the interaction which can be maintained above the adsorbate. Positions of single adsorbed gold atoms within the unit cell have been determined despite their easy removal at slightly higher interaction strength. Preliminary manipulation experiments indicate a pick-up process for the vanishing of the gold adatoms from the film surface.
非接触原子力显微镜(NC-AFM)已在低温(5 K)下在超高真空(UHV)中对生长在 NiAl(110) 上的氧化铝薄膜进行了研究。结果再现了结构模型的形貌,与扫描隧道显微镜(STM)图像不同。配备这种非凡的对比度,扩展缺陷的网络,它源于与薄膜表面相交的畴界,可以在原子细节中进行分析。对表面结构的了解为确定氧化铝薄膜上单个吸附物的吸附位置提供了机会。这种成像的难度取决于基底的成像特性和可以在吸附物上方保持的相互作用。尽管在稍高的相互作用强度下,它们很容易被去除,但仍确定了单个吸附金原子在单元内的位置。初步的操纵实验表明,从薄膜表面去除金原子的过程是一种拾取过程。