The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Small. 2012 Apr 23;8(8):1264-9. doi: 10.1002/smll.201101648. Epub 2012 Feb 15.
The cantilever dynamics in single-frequency scanning probe microscopy (SPM) are undefined due to having only two output variables, which leads to poorly understood image contrast. To address this shortcoming, generalized phase imaging scanning probe microscopy (GP-SPM), based on broad band detection and multi-eigenmode operation, is developed and demonstrated on diamond nanoparticles with different functionalization layers. It is shown that rich information on tip-surface interactions can be acquired by separating the response amplitude, instant resonance frequency, and quality factor. The obtained data allow high-resolution imaging even in the ambient environment. By tuning the strength of tip-surface interaction, different surface functionalizations can be discerned.
在单频扫描探针显微镜（SPM）中，由于只有两个输出变量，因此悬臂梁动力学是未定义的，这导致图像对比度难以理解。为了解决这个缺点，基于宽带检测和多本征模操作的广义相衬扫描探针显微镜（GP-SPM）得到了发展，并在具有不同功能化层的金刚石纳米粒子上进行了演示。结果表明，通过分离响应幅度、瞬时共振频率和品质因数，可以获得丰富的针尖-表面相互作用信息。即使在环境条件下，也可以获得高分辨率的图像。通过调节针尖-表面相互作用的强度，可以分辨出不同的表面功能化。
