Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA.
Beilstein J Nanotechnol. 2014 Mar 14;5:298-307. doi: 10.3762/bjnano.5.33. eCollection 2014.
This paper illustrates through numerical simulation the complexities encountered in high-damping AFM imaging, as in liquid enviroments, within the specific context of multifrequency atomic force microscopy (AFM). The focus is primarily on (i) the amplitude and phase relaxation of driven higher eigenmodes between successive tip-sample impacts, (ii) the momentary excitation of non-driven higher eigenmodes and (iii) base excitation artifacts. The results and discussion are mostly applicable to the cases where higher eigenmodes are driven in open loop and frequency modulation within bimodal schemes, but some concepts are also applicable to other types of multifrequency operations and to single-eigenmode amplitude and frequency modulation methods.
本文通过数值模拟说明了在多频原子力显微镜（AFM）的特定背景下，在液体环境中，高阻尼 AFM 成像所遇到的复杂性。重点主要是（i）在连续的针尖-样品撞击之间，驱动的更高本征模式的幅度和相位弛豫，（ii）非驱动的更高本征模式的瞬时激发，以及（iii）基底激发伪影。结果和讨论主要适用于在双模方案中开环和频率调制驱动更高本征模式的情况，但一些概念也适用于其他类型的多频操作和单本征模式幅度和频率调制方法。
