Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.
Micron. 2012 Jul;43(7):827-31. doi: 10.1016/j.micron.2012.02.006. Epub 2012 Feb 19.
Variable resolution fluctuation electron microscopy (FEM) experiments are implemented with hollow-cone dark-field transmission electron microscopy. Medium range order lengths of zirconium and iron based bulk metallic glasses and amorphous silicon nitride are determined from the FEM results. It shows that maximum normalized intensity variances of FEM images occur when their nominal resolution approaches the correlation length Λ of the amorphous materials. Additionally, differences in the length and magnitude of medium range order are compared between metallic and covalent bond amorphous materials.
采用中空锥暗场透射电子显微镜进行了可变分辨率波动电子显微镜（FEM）实验。从 FEM 结果确定了锆和铁基块状金属玻璃以及非晶硅氮化物的中程有序长度。结果表明，当 FEM 图像的名义分辨率接近非晶材料的相关长度Λ时，其归一化强度方差达到最大值。此外，还比较了金属键和共价键非晶材料的中程有序长度和大小的差异。
