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[一种正畸带环粘结技术;釉质及充填物损伤的扫描电镜研究及避免损伤的保护性蜡技术]

[A technic for cementing orthodontic bands; SEM research on the enamel and filling damages and a protective wax technic to avoid them].

作者信息

Radlanski R J

机构信息

Abteilung Kieferorthopädie, Universität Göttingen.

出版信息

Fortschr Kieferorthop. 1990 Oct;51(5):277-83. doi: 10.1007/BF02168929.

Abstract

Damage of enamel and filling margins occurs during the removal of zinc phosphate cement with hooks and scalers after band cementation. This was revealed by scanning electron microscopy in different stages of the study in vitro and in vivo. When glass ionomer cement was used, and although the surplus cement was wiped off still being plastic, it could not be avoided that cement was wiped into the fissures and stuck to the slopes of the cusps. A protection of the occlusal surface with wax as described in this study is helpful for both using glass ionomer and zinc phosphate cement. Contamination of the occlusal surface with cement is avoided, and the isolating effect reduces the necessity to scratch off cement surplus.

摘要

在带环粘结后用钩子和洁治器去除磷酸锌水门汀的过程中,会出现牙釉质和充填边缘的损伤。这在体外和体内研究的不同阶段通过扫描电子显微镜得以揭示。当使用玻璃离子水门汀时,尽管在水泥仍呈塑性时就将多余的水泥擦掉,但仍无法避免水泥被擦入裂隙并粘附在牙尖斜面上。本研究中所述的用蜡保护咬合面,无论是对于使用玻璃离子水门汀还是磷酸锌水门汀都有帮助。可避免咬合面被水泥污染,且隔离作用减少了刮除多余水泥的必要性。

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