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在 YSZ/Pt 界面处的氧化还原反应的原位分析电子显微镜研究。

In situ analytical electron microscopy studies of redox reactions at a YSZ/Pt interface.

机构信息

Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japan.

出版信息

Microsc Microanal. 2012 Jun;18(3):538-44. doi: 10.1017/S143192761200027X.

Abstract

Redox reactions were studied at a single yttria-stabilized zirconia (YSZ)/Pt electrode interface, in parallel with pure YSZ with no catalyst electrode, by in situ analytical electron microscopy at elevated temperatures and in an oxygen atmosphere. In situ electron holography showed that the oxide underwent reduction at elevated temperatures in a vacuum and was consequently reoxidized upon exposure to an oxygen flux at the same temperature. In situ energy loss spectroscopy measurements were in agreement with in situ electron holography observations and indicated that the oxidation state of the host cation zirconium was altered in the reduced state of the YSZ to the metastable state Zr(3+).

摘要

在高温和氧气气氛中,通过原位分析电子显微镜研究了氧化钇稳定氧化锆(YSZ)/Pt 电极界面上的氧化还原反应,同时还研究了没有催化剂的纯 YSZ 电极。原位电子全息术表明,氧化物在真空中于高温下发生还原,随后在相同温度下暴露于氧气流中时被重新氧化。原位能量损失光谱测量与原位电子全息术观察结果一致,并表明在 YSZ 的还原态中,宿主阳离子锆的氧化态被改变为亚稳态 Zr(3+)。

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