Chen Z Y, Zhang Y, Zhang X Q, Luo Y H, Jin W, Li J C, Chen Z P, Wang Z J, Yang Z J, Zhuang G
State Key Laboratory of Advanced Electromagnetic Engineering and Technology, College of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
Rev Sci Instrum. 2012 May;83(5):056108. doi: 10.1063/1.4721659.
The runaway electrons have been measured by hard x-ray detectors and soft x-ray array in the J-TEXT tokamak. The hard x-ray radiations in the energy ranges of 0.5-5 MeV are measured by two NaI detectors. The flux of lost runaway electrons can be obtained routinely. The soft x-ray array diagnostics are used to monitor the runaway beam generated in disruptions since the soft x-ray is dominated by the interaction between runaway electrons and metallic impurities inside the plasma. With the aid of soft x-ray array, runaway electron beam has been detected directly during the formation of runaway current plateau following the disruptions.
在J-TEXT托卡马克装置中，逃逸电子已通过硬X射线探测器和软X射线阵列进行了测量。能量范围在0.5 - 5 MeV的硬X射线辐射由两个碘化钠探测器进行测量。常规情况下可获得损失的逃逸电子通量。软X射线阵列诊断用于监测破裂过程中产生的逃逸束流，因为软X射线主要由等离子体内逃逸电子与金属杂质之间的相互作用产生。借助软X射线阵列，在破裂后逃逸电流平台形成期间直接检测到了逃逸电子束。
