注意：J-TEXT托卡马克装置中逃逸电子的测量。

Note: measurement of the runaway electrons in the J-TEXT tokamak.

作者信息

Chen Z Y, Zhang Y, Zhang X Q, Luo Y H, Jin W, Li J C, Chen Z P, Wang Z J, Yang Z J, Zhuang G

机构信息

State Key Laboratory of Advanced Electromagnetic Engineering and Technology, College of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.

出版信息

Rev Sci Instrum. 2012 May;83(5):056108. doi: 10.1063/1.4721659.

DOI:10.1063/1.4721659

PMID:22667672

Abstract

The runaway electrons have been measured by hard x-ray detectors and soft x-ray array in the J-TEXT tokamak. The hard x-ray radiations in the energy ranges of 0.5-5 MeV are measured by two NaI detectors. The flux of lost runaway electrons can be obtained routinely. The soft x-ray array diagnostics are used to monitor the runaway beam generated in disruptions since the soft x-ray is dominated by the interaction between runaway electrons and metallic impurities inside the plasma. With the aid of soft x-ray array, runaway electron beam has been detected directly during the formation of runaway current plateau following the disruptions.

摘要

在J-TEXT托卡马克装置中，逃逸电子已通过硬X射线探测器和软X射线阵列进行了测量。能量范围在0.5 - 5 MeV的硬X射线辐射由两个碘化钠探测器进行测量。常规情况下可获得损失的逃逸电子通量。软X射线阵列诊断用于监测破裂过程中产生的逃逸束流，因为软X射线主要由等离子体内逃逸电子与金属杂质之间的相互作用产生。借助软X射线阵列，在破裂后逃逸电流平台形成期间直接检测到了逃逸电子束。