Radiobiology for Children's Health Program, Research Center for Radiation Protection, National Institute of Radiological Sciences, Inage-Ku, Chiba, Japan.
Int J Cancer. 2013 Jan 15;132(2):259-68. doi: 10.1002/ijc.27668. Epub 2012 Jun 26.
Cancer risk associated with radiation exposure is considered the result of concurrent exposure to other natural and manmade carcinogens. Available data on the molecular characteristics of cancer after simultaneous exposure to radiation and chemicals are insufficient. In our study, we used a mouse thymic lymphoma (TL) model that was synergistically induced by simultaneous exposure to X-rays and N-ethyl-N-nitrosourea (ENU) at subcarcinogenic doses and analyzed the mutation frequency and spectrum of the TL-associated genes Ikaros, Notch1, p53 and Kras. We found that the point mutation frequency in Ikaros was significantly increased to 47% for simultaneous exposure compared to 13 and 0% for X-ray and ENU exposure alone, respectively. These mutations were mostly G:C > A:T at non-CpG sites and T:A > C:G, both of which are characteristic of ENU mutagenesis. About half of the point mutations were accompanied by loss of heterozygosity (LOH), typical of X-irradiation. The remaining half did not include LOH, which suggests that they were dominant-negative mutations. In Notch1, the frequency of abnormalities was high (>58%) regardless of the treatment, suggesting that Notch1 aberration may be important for T-cell lymphomagenesis. The p53 and Kras mutation frequencies were low for all treatments (<23%). Importantly, the frequency of TLs containing mutations in multiple genes, especially both Ikaros and Notch1, increased after simultaneous exposure. Thus, after simultaneous exposure, Ikaros is a critical target and is inactivated by ENU-induced point mutations and/or X-ray-induced LOH in T-cell lymphomagenesis. Furthermore, concomitant alterations of multiple tumor-associated genes may contribute to enhanced lymphomagenesis after simultaneous exposure.
辐射暴露相关的癌症风险被认为是同时暴露于其他天然和人为致癌物的结果。关于同时暴露于辐射和化学物质后癌症的分子特征的可用数据还不够充分。在我们的研究中,我们使用了一种小鼠胸腺淋巴瘤 (TL) 模型,该模型通过亚致癌剂量的 X 射线和 N-乙基-N-亚硝脲 (ENU) 同时暴露协同诱导,并分析了 TL 相关基因 Ikaros、Notch1、p53 和 Kras 的突变频率和谱。我们发现,与单独接受 X 射线和 ENU 暴露相比,Ikaros 的点突变频率在同时暴露时显著增加到 47%,分别为 13%和 0%。这些突变主要是非 CpG 位点的 G:C> A:T 和 T:A> C:G,这两种突变均为 ENU 诱变的特征。大约一半的点突变伴随着杂合性丢失 (LOH),这是 X 射线照射的典型特征。其余的一半不包括 LOH,这表明它们是显性负突变。在 Notch1 中,无论治疗如何,异常频率都很高 (>58%),表明 Notch1 异常对于 T 细胞淋巴瘤的发生可能很重要。p53 和 Kras 的突变频率在所有治疗中均较低(<23%)。重要的是,在同时暴露后,含有多个基因突变的 TL 的频率增加,特别是同时含有 Ikaros 和 Notch1 的突变。因此,在同时暴露后,Ikaros 是一个关键靶点,其通过 ENU 诱导的点突变和/或 X 射线诱导的 LOH 在 T 细胞淋巴瘤发生中失活。此外,多个肿瘤相关基因的同时改变可能有助于同时暴露后增强淋巴瘤的发生。