Ri Shien, Muramatsu Takashi
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 2, Tsukuba 305-8568, Japan. ri‐
Appl Opt. 2012 Jun 1;51(16):3214-23. doi: 10.1364/AO.51.003214.
Recently, a rapid and accurate single-shot phase measurement technique called the sampling moiré method has been developed for small-displacement distribution measurements. In this study, the theoretical phase error of the sampling moiré method caused by linear intensity interpolation in the case of a mismatch between the sampling pitch and the original grating pitch is analyzed. The periodic phase error is proportional to the square of the spatial angular frequency of the moiré fringe. Moreover, an effective phase compensation methodology is developed to reduce the periodic phase error. Single-shot phase analysis can perform accurately even when the sampling pitch is not matched to the original grating pitch exactly. The primary simulation results demonstrate the effectiveness of the proposed phase compensation methodology.
最近,一种名为采样莫尔法的快速准确的单次相位测量技术已被开发用于小位移分布测量。在本研究中,分析了在采样间距与原始光栅间距不匹配的情况下,由线性强度插值引起的采样莫尔法的理论相位误差。周期性相位误差与莫尔条纹的空间角频率的平方成正比。此外,还开发了一种有效的相位补偿方法来减少周期性相位误差。即使采样间距与原始光栅间距不完全匹配,单次相位分析也能准确进行。主要仿真结果证明了所提出的相位补偿方法的有效性。