Chen Shanyong, Liao Wenlin, Dai Yifan, Li Shengyi
College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha, Hunan, China.
Appl Opt. 2012 Jun 10;51(17):3817-25. doi: 10.1364/AO.51.003817.
Limited by the f-number of the transmission sphere, it is impossible to test the whole surface of a hyper-hemisphere using a standard interferometer directly. This paper presents an extension of the subaperture stitching test method to hyper hemispheres. The stitching algorithm is based on the coordinate mapping from local measurement frame to a global frame, and overlapping correspondence is calculated by virtue of coordinates of latitude and longitude. The reference surface error is represented by Zernike polynomials and self-calibrated during the stitching to achieve higher accuracy. Then the stitched surface error distribution is presented by map projection. To realize accessibility to the whole surface of a hyper-hemisphere, we also propose a design for the subaperture test platform, according to the subaperture lattice design. Finally, a hemisphere and a full sphere are tested and figured, respectively, to validate the method and the experimental setup.
由于传输球面的光圈数限制，使用标准干涉仪直接测试超半球的整个表面是不可能的。本文提出了一种将子孔径拼接测试方法扩展到超半球的方法。拼接算法基于从局部测量框架到全局框架的坐标映射，并借助经纬度坐标计算重叠对应关系。参考面误差由泽尼克多项式表示，并在拼接过程中进行自校准以实现更高的精度。然后通过地图投影呈现拼接后的表面误差分布。为了实现对超半球整个表面的可达性，我们还根据子孔径点阵设计提出了一种子孔径测试平台的设计方案。最后，分别对一个半球和一个完整球体进行了测试和加工，以验证该方法和实验装置。
