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用于电子倍增电荷耦合器件(EMCCD)成像并应用于单分子显微镜的费舍尔信息

FISHER INFORMATION FOR EMCCD IMAGING WITH APPLICATION TO SINGLE MOLECULE MICROSCOPY.

作者信息

Chao Jerry, Ward E Sally, Ober Raimund J

机构信息

Department of Electrical Engineering, University of Texas at Dallas, Richardson, TX.

出版信息

Conf Rec Asilomar Conf Signals Syst Comput. 2010:1085-1089. doi: 10.1109/ACSSC.2010.5757570.

Abstract

Owing to its high quantum efficiency, the charge-coupled device (CCD) is an important imaging tool employed in biological applications such as single molecule microscopy. Under extremely low light conditions, however, a CCD is generally unsuitable because its readout noise can easily overwhelm the weak signal. Instead, an electron-multiplying charge-coupled device (EMCCD), which stochastically amplifies the acquired signal to drown out the readout noise, can be used. We have previously proposed a framework for calculating the Fisher information, and hence the Cramer-Rao lower bound, for estimating parameters (e.g., single molecule location) from the images produced by an optical microscope. Here, we develop the theory that is needed for deriving, within this framework, performance measures pertaining to the estimation of parameters from an EMCCD image. Our results allow the comparison of a CCD and an EMCCD in terms of the best accuracy with which parameters can be estimated from their acquired images.

摘要

由于其高量子效率,电荷耦合器件(CCD)是一种重要的成像工具,用于诸如单分子显微镜等生物学应用。然而,在极低光照条件下,CCD通常并不适用,因为其读出噪声很容易淹没微弱信号。取而代之的是,可以使用电子倍增电荷耦合器件(EMCCD),它能随机放大采集到的信号以消除读出噪声。我们之前提出了一个用于计算费舍尔信息从而得出克拉美罗下界的框架,以便从光学显微镜产生的图像中估计参数(例如单分子位置)。在此,我们发展了在这个框架内推导与从EMCCD图像估计参数相关的性能度量所需的理论。我们的结果使得能够在从采集图像估计参数的最佳精度方面对CCD和EMCCD进行比较。

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本文引用的文献

1
Fisher information matrix for branching processes with application to electron-multiplying charge-coupled devices.
Multidimens Syst Signal Process. 2012 Sep;23(3):349-379. doi: 10.1007/s11045-011-0150-7.
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Do-it-yourself guide: how to use the modern single-molecule toolkit.
Nat Methods. 2008 Jun;5(6):475-89. doi: 10.1038/nmeth.1215.
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Biophys J. 2004 Feb;86(2):1185-200. doi: 10.1016/S0006-3495(04)74193-4.
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Precise nanometer localization analysis for individual fluorescent probes.
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