Rollinson Claire M, Wade Scott A, Kouskousis Betty P, Kitcher Daniel J, Baxter Greg W, Collins Stephen F
Optical Technology Research Laboratory, School of Engineering and Science, Victoria University, Melbourne, VIC, Australia.
J Opt Soc Am A Opt Image Sci Vis. 2012 Jul 1;29(7):1259-68. doi: 10.1364/JOSAA.29.001259.
The growth of reflectance peaks from optical fiber Bragg gratings has been studied to determine the relative importance of grating features when writing with the phase-mask technique. Measurements of spectra for two different fiber types using two distinct phase masks allowed the contribution from grating features of half the phase-mask periodicity and of the phase-mask periodicity at the Bragg wavelength to be determined. The dominance of the latter periodicity was ascribed to either the small fiber core diameter that limited the extent of the Talbot diffraction pattern, or the enhanced ±2 diffraction orders of a custom-made phase mask used.
为了确定使用相位掩膜技术写入光纤布拉格光栅时光栅特征的相对重要性，对光纤布拉格光栅反射峰的增长进行了研究。使用两种不同的相位掩膜对两种不同光纤类型的光谱进行测量，从而确定了相位掩膜周期一半处和布拉格波长处相位掩膜周期的光栅特征所起的作用。后一种周期的主导地位归因于限制塔尔博特衍射图案范围的小光纤芯径，或者归因于所使用的定制相位掩膜增强的±2衍射级次。
