Ţibu M, Lostun M, Óvári T-A, Chiriac H
National Institute of Research and Development for Technical Physics, 47 Mangeron Boulevard, 700050 Iaşi, Romania.
Rev Sci Instrum. 2012 Jun;83(6):064708. doi: 10.1063/1.4729601.
The controlled nucleation and propagation of magnetic domain walls in ultrathin ferromagnetic wires, such as nanowires and submicrometer wires, is extremely important for the development of new high performance magnetic domain wall logic devices. Therefore, it is equally essential to possess adequate advanced experimental investigation techniques in order to be able to achieve a comprehensive in situ analysis of as many as possible parameters related to the domain wall propagation, e.g., wall shape besides wall velocity and position. In this paper, we report on a method developed specifically for the investigation of the shape of propagating magnetic domain walls in ultrathin magnetic wires, i.e., with the diameter of the magnetic wire in the range 100-950 nm. The newly developed experimental method is based on the simultaneous use of two full-fledged experimental techniques: the magneto-optical Kerr effect for analyzing the surface effects of the passing domain wall and the Sixtus-Tonks method for the investigation of the entire moving wall. The results obtained offer essential information about the shape of the propagating magnetic domain walls, being unique to this new method.
在诸如纳米线和亚微米线等超薄铁磁线中，磁畴壁的受控成核与传播对于新型高性能磁畴壁逻辑器件的发展极为重要。因此，拥有足够先进的实验研究技术同样至关重要，以便能够对与畴壁传播相关的尽可能多的参数进行全面的原位分析，例如除了壁速度和位置之外的壁形状。在本文中，我们报告了一种专门为研究超薄磁线中传播的磁畴壁形状而开发的方法，即磁线直径在100 - 950 nm范围内。新开发的实验方法基于同时使用两种成熟的实验技术：用于分析通过的畴壁表面效应的磁光克尔效应和用于研究整个移动壁的西克斯图斯 - 汤克斯方法。所获得的结果提供了关于传播磁畴壁形状的重要信息，这是这种新方法所独有的。
