Svensen Oyvind, Kildemo Morten, Maria Jerome, Stamnes Jakob J, Frette Øyvind
Department of Physics and Technology, University of Bergen, P.O. Box 7803, N-5020 Bergen, Norway.
Opt Express. 2012 Jul 2;20(14):15045-53. doi: 10.1364/OE.20.015045.
The full Mueller matrix for a Spectralon white reflectance standard was measured in the incidence plane, to obtain the polarization state of the scattered light for different angles of illumination. The experimental setup was a Mueller matrix ellipsometer, by which measurements were performed for scattering angles measured relative to the normal of the Spectralon surface from -90° to 90° sampled at every 2.5° for an illumination wavelength of 532 nm. Previously, the polarization of light scattered from Spectralon white reflectance standards was measured only for four of the elements of the Muller matrix. As in previous investigations, the reflection properties of the Spectralon white reflectance standard was found to be close to those of a Lambertian surface for small scattering and illumination angles. At large scattering and illumination angles, all elements of the Mueller matrix were found to deviate from those of a Lambertian surface. A simple empirical model with only two parameters, was developed, and used to simulate the measured results with fairly good accuracy.
在入射平面内测量了Spectralon白色反射标准的完整穆勒矩阵，以获得不同照明角度下散射光的偏振态。实验装置是一台穆勒矩阵椭偏仪，在532nm照明波长下，以相对于Spectralon表面法线从-90°到90°的散射角进行测量，每2.5°采样一次。此前，仅对穆勒矩阵的四个元素测量了从Spectralon白色反射标准散射的光的偏振。与之前的研究一样，发现对于小散射角和照明角，Spectralon白色反射标准的反射特性接近朗伯表面。在大散射角和照明角下，发现穆勒矩阵的所有元素都偏离了朗伯表面。开发了一个仅具有两个参数的简单经验模型，并用于以相当高的精度模拟测量结果。
