Lee Byeonghee, King William P
Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, Illinois 61801, USA.
Rev Sci Instrum. 2012 Jul;83(7):074902. doi: 10.1063/1.4732861.
This article describes temperature measurement of a heated atomic force microscope cantilever using the 2ω and 3ω harmonics of the cantilever temperature signal. When the cantilever is periodically heated, large temperature oscillations lead to large changes in the cantilever electrical resistance and also lead to nonconstant temperature coefficient of resistance. We model the cantilever heating to account for these sources of nonlinearity, and compare models with experiment. When the heating voltage amplitude is 17.9 V over the driving frequency range 10 Hz-34 kHz, the cantilever temperature oscillation is between 5 °C and 200 °C. Over this range, the corrected 2ω method predicts cantilever temperature to within 16% and the corrected 3ω method predicts the cantilever temperature within 3%. We show a general method for predicting the periodic cantilever temperature, sources of errors, and corrections for these errors.
本文描述了利用加热原子力显微镜悬臂梁温度信号的二次谐波(2ω)和三次谐波(3ω)来测量其温度。当悬臂梁被周期性加热时,较大的温度振荡会导致悬臂梁电阻发生较大变化,同时也会导致电阻温度系数不稳定。我们对悬臂梁加热过程进行建模,以考虑这些非线性来源,并将模型与实验进行比较。当驱动频率范围为10Hz至34kHz时,加热电压幅度为17.9V,悬臂梁温度振荡在5°C至200°C之间。在此范围内,经过修正的2ω方法预测悬臂梁温度的误差在16%以内,经过修正的3ω方法预测悬臂梁温度的误差在3%以内。我们展示了一种预测周期性悬臂梁温度、误差来源以及这些误差校正的通用方法。