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980nm 半导体激光辅助全牙弓龈上纤维切断术对氟斑牙根面的影响。

Effect of 980-nm diode laser-aided circumferential supracrestal fiberotomy on fluorosed root surfaces.

机构信息

Department of Periodontics, Sri Venkateshwara Dental College, Bangalore, Karnataka, India.

出版信息

Angle Orthod. 2013 May;83(3):425-30. doi: 10.2319/052212-419.1. Epub 2012 Aug 13.

Abstract

OBJECTIVE

To evaluate and compare the root surface morphological changes after 980-nm diode laser-aided circumferential supracrestal fiberotomy (CSF) on fluorosed and non-fluorosed teeth.

MATERIALS AND METHODS

The sample comprised 27 orthodontic patients (14 males and 13 females; mean age  =  17.3 years) with and without fluorosis, from whom 40 fluorosed and 40 non-fluorosed premolar teeth were extracted for orthodontic reasons. Conventional (control group) and laser-aided (experimental group) CSF was performed on fluorosed and non-fluorosed teeth indicated for orthodontic extraction, using a scalpel and a 980-nm diode laser at 2.5 W power, respectively. Subsequently, teeth were extracted, sectioned, and examined by scanning electron microscope to assess the ultrastructural changes.

RESULTS

There were differences in surface morphology among fluorosed and non-fluorosed roots in the control group. The root specimens of both fluorosed and non-fluorosed teeth irradiated by diode laser exhibited no evidence of smear layer, laser-induced pitting or cavitation, linear cuts/markings, carbonization of surface, and heat-induced surface cracking. However, a glazed or slightly melted appearance was observed in root specimens of fluorosed teeth after diode laser irradiation.

CONCLUSIONS

These findings suggest that the diode laser-aided CSF procedure is free from thermal hazard on non-fluorosed root surfaces but may provoke some thermal changes on fluorosed root surfaces.

摘要

目的

评估并比较 980nm 半导体激光辅助环形龈上纤维切开术(CSF)对氟斑牙和非氟斑牙根面形态学改变的效果。

材料与方法

本研究纳入了 27 名正畸患者(男 14 例,女 13 例;平均年龄 17.3 岁),其中 14 名患者有氟斑牙,13 名患者无氟斑牙。因正畸需要,从这些患者中分别拔出 40 颗氟斑牙和 40 颗非氟斑牙。分别采用传统手术(对照组)和激光辅助手术(实验组)对氟斑牙和非氟斑牙进行 CSF,使用手术刀和 980nm 半导体激光(功率 2.5W)。随后,将牙齿拔出、切片,用扫描电子显微镜观察超微结构变化。

结果

在对照组中,氟斑牙和非氟斑牙的根面形态存在差异。经激光照射后的氟斑牙和非氟斑牙的根面标本均未见玷污层、激光诱导的凹坑或空化、线性切割/标记、表面碳化和热诱导表面裂纹。然而,经二极管激光照射后的氟斑牙根面标本呈现出一种光滑或轻微熔融的外观。

结论

这些结果表明,半导体激光辅助 CSF 术不会对非氟斑牙根面造成热危害,但可能会对氟斑牙根面造成一些热改变。

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