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无针孔近场光学显微镜的点偶极子探针互惠理论。

Reciprocity theory of apertureless scanning near-field optical microscopy with point-dipole probes.

机构信息

Max Planck Institute for Solid State Research, Stuttgart, Germany.

出版信息

ACS Nano. 2012 Sep 25;6(9):8173-82. doi: 10.1021/nn302864d. Epub 2012 Aug 22.

DOI:10.1021/nn302864d
PMID:22897563
Abstract

Near-field microscopy offers the opportunity to reveal optical contrast at deep subwavelength scales. In scanning near-field optical microscopy (SNOM), the diffraction limit is overcome by a nanoscopic probe in close proximity to the sample. The interaction of the probe with the sample fields necessarily perturbs the bare sample response, and a critical issue is the interpretation of recorded signals. For a few specific SNOM configurations, individual descriptions have been modeled, but a general and intuitive framework is still lacking. Here, we give an exact formulation of the measurable signals in SNOM which is easily applicable to experimental configurations. Our results are in close analogy with the description Tersoff and Hamann have derived for the tunneling currents in scanning tunneling microscopy. For point-like scattering probe tips, such as used in apertureless SNOM, the theory simplifies dramatically to a single scalar relation. We find that the measured signal is directly proportional to the field of the coupled tip-sample system at the position of the tip. For weakly interacting probes, the model thus verifies the empirical findings that the recorded signal is proportional to the unperturbed field of the bare sample. In the more general case, it provides guidance to an intuitive and faithful interpretation of recorded images, facilitating the characterization of tip-related distortions and the evaluation of novel SNOM configurations, both for aperture-based and apertureless SNOM.

摘要

近场显微镜提供了在亚波长深度下揭示光学对比度的机会。在扫描近场光学显微镜(SNOM)中,通过纳米级探针与样品近距离接近来克服衍射极限。探针与样品场的相互作用必然会干扰裸样品的响应,一个关键问题是对记录信号的解释。对于少数特定的 SNOM 配置,可以对个别描述进行建模,但仍然缺乏通用和直观的框架。在这里,我们给出了 SNOM 中可测量信号的精确公式,该公式易于应用于实验配置。我们的结果与 Tersoff 和 Hamann 为扫描隧道显微镜中的隧道电流推导的描述非常相似。对于点状散射探针尖端,如在无孔径 SNOM 中使用的那样,理论会简化为一个单一的标量关系。我们发现,测量信号与探针尖端位置处的耦合尖端-样品系统的场直接成正比。对于弱相互作用的探针,该模型因此验证了记录信号与裸样品的未受扰场成正比的经验发现。在更一般的情况下,它为记录图像的直观和忠实解释提供了指导,有助于对与尖端相关的失真进行特征描述,并对基于孔径和无孔径的 SNOM 的新型 SNOM 配置进行评估。

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