Bachelot Renaud, Lerondel Gilles, Blaize Sylvain, Aubert Sebastien, Bruyant Aurelien, Royer Pascal
Laboratoire de Nanotechnologie et d'Instrumentation Optique, CNRS FRE 2671, Université de Technologie de Troyes-12, BP2060.10010 Troyes, France.
Microsc Res Tech. 2004 Aug;64(5-6):441-52. doi: 10.1002/jemt.20102.
This report presents the Apertureless Scanning Optical Near-Field Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with sub-wavelength resolution. We present an overview of the results we obtained in our laboratory over the past few years. By significant examples, it is shown that this specific probe microscopy allows for in situ local quantitative study of semiconductor lasers in operation, integrated optical waveguides produced by ion exchange (single channel or Y junction), and photonic structures.
本报告介绍了无孔径扫描光学近场显微镜，它是一种用于表征具有亚波长分辨率的现代光电器件和光子器件的强大工具。我们概述了过去几年在我们实验室中获得的结果。通过大量实例表明，这种特定的探针显微镜能够对工作中的半导体激光器、离子交换产生的集成光波导（单通道或Y形结）以及光子结构进行原位局部定量研究。
