Viana Rommel B, Da Silva Albérico B F, Pimentel André S
Department of Chemistry and Molecular Physics, Institute of Chemistry of São Carlos, University of São Paulo,13560-970, São Carlos, SP, Brazil.
Department of Chemistry, Pontifical Catholic University of Rio de Janeiro, 22453-900, Rio de Janeiro, RJ, Brazil.
Int J Mol Sci. 2012;13(7):7980-7993. doi: 10.3390/ijms13077980. Epub 2012 Jun 28.
This paper describes the adsorption of sodium dodecyl sulfate (SDS) molecules in a low polar solvent on Ge substrate by using Fourier transform infrared-attenuated total reflection (FTIR-ATR) spectroscopy and atomic force microscopy (AFM). The maximum SDS amount adsorbed is (5.0 ± 0.3) × 10(14) molecules cm(-2) in CHCl(3), while with the use of CCl(4) as subphase the ability of SDS adsorbed is 48% lower. AFM images show that depositions are highly disordered over the interface, and it was possible to establish that the size of the SDS deposition is around 30-40 nm over the Ge surface. A complete description of the infrared spectroscopic bands for the head and tail groups in the SDS molecule is also provided.
本文利用傅里叶变换红外衰减全反射光谱(FTIR-ATR)和原子力显微镜(AFM)描述了十二烷基硫酸钠(SDS)分子在低极性溶剂中于锗衬底上的吸附情况。在氯仿中吸附的SDS最大量为(5.0 ± 0.3) × 10(14) 个分子/平方厘米,而以四氯化碳作为亚相时,SDS的吸附能力降低48%。AFM图像显示,沉积物在界面上高度无序,并且可以确定在锗表面上SDS沉积物的尺寸约为30 - 40纳米。文中还提供了SDS分子中头部和尾部基团红外光谱带的完整描述。